Redefining Surface Metrology with a Wider Field of View
This next-generation accessory offers the widest commercially available interferometric field-of-view (FOV) for high-speed, high-precision surface metrology—delivering a remarkable 60 mm FOV in a single measurement. Designed for industries like semiconductor, photonics, AR waveguides, and precision machining, the 0.5X ZWF Objective enables rapid, accurate measurements of rough to smooth surfaces, including those with transparent or semi-transparent films.
Optimised for Accuracy, Speed, and Ease of Use
Key features include single-scan flatness and film thickness analysis, seamless surface stitching, and a 45 mm working distance with 19.0 µm optical resolution. The objective works with Zygo’s Mx software, featuring Part Finder and SmartSetup™ for streamlined focus and alignment.
Whether for inspecting semiconductor wafers, optical stacks, or machined components, the 0.5X ZWF Objective—built for Zygo’s non-contact optical profilers—delivers significantly faster, more actionable metrology data and reduces stitching time by up to 75%.
See Zygo in Action at SPIE Optics + Photonics 2025
Visit Zygo at booth #315 to experience live demonstrations of the 0.5X ZWF Objective and discover how it’s reshaping large-area, high-speed interferometric metrology.
